The Test access port and boundary-scan architecture /
[edited by] Colin M. Maunder, Rodham E. Tulloss.
- Los Alamitos, Calif. : IEEE Computer Society Press, c1991.
- xxii, 372 p. : ill. ; 29 cm.
- IEEE Computer Society Press tutorial .
Includes bibliographical references and index.
0818690704 (case) 0818660708 (microfiche)
90039682
Electronic circuits--Testing--Data processing.
Computer architecture.
Boundary scan testing.
TK7867 / .T39 1990
TK 7867 .T39 1990
Includes bibliographical references and index.
0818690704 (case) 0818660708 (microfiche)
90039682
Electronic circuits--Testing--Data processing.
Computer architecture.
Boundary scan testing.
TK7867 / .T39 1990
TK 7867 .T39 1990