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The Test access port and boundary-scan architecture /

by Maunder, Colin M; Tulloss, Rodham E.
Material type: materialTypeLabelBookSeries: IEEE Computer Society Press tutorial. Publisher: Los Alamitos, Calif. : IEEE Computer Society Press, c1991Description: xxii, 372 p. : ill. ; 29 cm.ISBN: 0818690704 (case); 0818660708 (microfiche).Subject(s): Electronic circuits -- Testing -- Data processing | Computer architecture | Boundary scan testing
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Epoka University Library
TK 7867 .T39 1990 (Browse shelf) Available

Includes bibliographical references and index.

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