The Test access port and boundary-scan architecture /
by Maunder, Colin M; Tulloss, Rodham E.
Material type:
BookSeries: IEEE Computer Society Press tutorial. Publisher: Los Alamitos, Calif. : IEEE Computer Society Press, c1991Description: xxii, 372 p. : ill. ; 29 cm.ISBN: 0818690704 (case); 0818660708 (microfiche).Subject(s): Electronic circuits -- Testing -- Data processing | Computer architecture | Boundary scan testing
| Item type | Location | Call number | Status | Date due |
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Books
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Epoka University Library
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TK 7867 .T39 1990 (Browse shelf) | Available |
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| TK 7816 .G75 1977 Basic electronics / | TK 7816 .Z33 1983 Basic electronics : | TK 7836 .F37 1992 Process improvement in the electronics industry / | TK 7867 .T39 1990 The Test access port and boundary-scan architecture / | TK 7868 .D5J635 1993 High-speed digital design : | TK 7868 .D5J635 1993 High-speed digital design : | TK 7868 .D5J635 1993 High-speed digital design : |
Includes bibliographical references and index.
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